Data-set supporting the article entitled "The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology"

This data-set supports the article entitled "The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology", accepted for the publication in Microelectronics Reliability DOI:10.1016/j.microrel.2016.10.018本数据集支撑题为《纳米级互补金属氧化物半导体（Complementary Metal-Oxide Semiconductor，CMOS）工艺中偏置温度不稳定性（Bias Temperature Instability，BTI）老化对电平转换器可靠性的影响》的论文，该论文已被《微电子可靠性》（Microelectronics Reliability）期刊录用待刊，其数字对象标识符（Digital Object Identifier，DOI）为10.1016/j.microrel.2016.10.018