EPID: The Enfield PCB Inspection Dataset for Visual Defect Detection

This dataset contains high-resolution images of printed circuit boards (PCBs) captured under controlled laboratory conditions for research on defect detection. It includes both undamaged boards and boards with artificially introduced defects (burned integrated circuits (ICs), melted IC pins, popped capacitors), documented step-by-step using a reproducible damage-planning procedure.

Each image is annotated with bounding boxes for integrated circuits (ICs) and capacitors in COCO format, accompanied by metadata detailing the damage type and sequence. Designed for training and benchmarking models in low-data-volume scenarios, the dataset supports applications in quality control, manufacturing, and computer vision research.

License: CC BY-SA 4.0Related resources: Dataset description [link]

本数据集收录了在受控实验室条件下拍摄的高分辨率印刷电路板（Printed Circuit Boards，PCBs）图像，用于缺陷检测领域的研究工作。数据集同时涵盖完好电路板与带有人工引入缺陷的电路板样本，缺陷类型包括烧毁的集成电路（Integrated Circuits，ICs）、熔融的集成电路引脚以及爆裂电容，并采用可复现的缺陷规划制备流程进行逐步骤记录。

每张图像均以COCO格式标注了集成电路与电容的边界框，并附带详细记录缺陷类型与发生顺序的元数据。本数据集专为小样本场景下的模型训练与基准测试设计，可应用于质量控制、制造业及计算机视觉研究领域。

许可证：CC BY-SA 4.0 相关资源：数据集说明 [链接]