The X-ray photoelectron spectroscopy (XPS) spectra of B&Ni2 sample

X-ray Photoelectron Spectroscopy (XPS) was used to study  the surface composition of B&Ni2+ in the B 1s, O 1s, C 1s, and Ni 2p regions during ex-situ measurements in different voltage windows (0.90, 1.23, 1.33 and 1.43 V). Measurements were conducted using Mg Ka radiation (hν = 1253.6 eV) in a Prevac system from Poland equipped with a Scienta SES 2002 electron energy analyzer. The XPS system operated with constant transmission energy (Ep = 50 eV), and the analysis chamber was evacuated to a pressure below 5⋅10-6 mbar.

本研究采用X射线光电子能谱（X-ray Photoelectron Spectroscopy, XPS），针对不同电压窗口（0.90、1.23、1.33与1.43 V）下开展的非原位测试，研究B与Ni²+在B 1s、O 1s、C 1s及Ni 2p能区的表面组成。测试实验依托产自波兰的Prevac系统完成，该系统搭载Scienta SES 2002型电子能量分析仪，以Mg Kα辐射（光子能量hν=1253.6 eV）作为激发源。XPS系统采用恒定透过能量模式运行（透过能量Ep=50 eV），分析室真空度被抽至5×10^-6毫巴以下。