波长色散X射线荧光光谱仪

波长色散X射线荧光光谱仪具有重现性好，测量速度快，灵敏度高的特点。能分析F(9)～U(92)之间所有元素。样品可以是固体、粉末、熔融片，液体等，分析对象适用于炼钢、有色金属、水泥、陶瓷、石油、玻璃等行业样品。无标半定量方法可以对各种形状样品定性分析，并能给出半定量结果，结果准确度对某些样品可以接近定量水平，分析时间短。薄膜分析软件FP-MULT1能作镀层分析，薄膜分析。可测多种元素如Na、Mg、Al、Si、 Cd、Pb、Cr、Hg、Br、Cl等。

Wavelength-dispersive X-ray fluorescence (WD-XRF) spectrometer exhibits favorable characteristics including excellent reproducibility, rapid measurement speed and high sensitivity. It is capable of analyzing all elements between fluorine (atomic number 9) and uranium (atomic number 92). The applicable sample forms include solids, powders, fused beads, liquids and other types. It is suitable for sample analysis in industries such as steelmaking, non-ferrous metals, cement, ceramics, petroleum and glass manufacturing. The standardless semi-quantitative analysis method enables qualitative analysis of samples with various shapes and provides semi-quantitative results. For certain samples, the accuracy of the results can approach that of quantitative analysis, with short analysis duration. Its thin film analysis software FP-MULT1 supports coating analysis and thin film analysis. It can detect multiple elements including Na, Mg, Al, Si, Cd, Pb, Cr, Hg, Br, Cl and others.