Time Resolved X-Ray Scattering Data Set

We have measured the time-resolved X-ray diffraction for a strained Ca2RuO4 thin film with various pump fluences at the X-ray free-electron lasers at SPring-8 Angstrom Compact free-electron Laser (SACLA), Japan. We have used an IR laser with 1.55 eV photon energy and 40 fs pulse duration as a pump to excite the system and femtosecond X-ray pulses with 10 keV photon energy as a probe to track the system dynamics. We monitored the out-of-plane 008 Bragg peak with the ground state held at 130 K, below the insulator-metal transition temperature of 200 K.

我们在日本SPring-8埃尺度紧凑型自由电子激光装置（SACLA）的X射线自由电子激光器（X-ray free-electron lasers）平台上，针对不同泵浦通量的应变态Ca₂RuO₄薄膜开展了时间分辨X射线衍射（time-resolved X-ray diffraction）测量。我们采用光子能量为1.55 eV、脉冲宽度为40 fs的红外激光器作为泵浦源激发样品体系，并以光子能量为10 keV的飞秒X射线脉冲作为探测脉冲，追踪体系的动力学演化过程。我们将样品基态温度维持在130 K（该温度低于其200 K的绝缘体-金属转变温度），并在此条件下监测面外008布拉格（Bragg）峰的信号变化。