The time-dependent results of the cell viability of eNSCs between sham group and exposed group.

eNSCs were exposed to 50 Hz ELF-EMF at a magnetic intensity of 2 mT for 1 day, 2 days and 3 days. The cell viability was examined by CCK-8 assay. Results were obtained from three independent experiments (Exp.1, Exp.2 and Exp.3) and the data were expressed as mean ± SD.aThe test for homogeneity of variance between sham groups and ELF-EMF groups was made by the Levene's test.bThe statistical evaluation between sham groups and ELF-EMF groups was made by the Student's t-test.将胚胎神经干细胞（embryonic neural stem cells, eNSCs）暴露于磁场强度为2 mT的50 Hz极低频电磁场（extremely low frequency electromagnetic field, ELF-EMF）中，分别处理1天、2天与3天。采用CCK-8检测法（Cell Counting Kit-8 assay）检测细胞活力。实验结果来自3次独立重复实验（Exp.1、Exp.2及Exp.3），数据以平均值±标准差（mean ± SD）表示。a. 采用莱文检验（Levene's test）对假照射组与极低频电磁场照射组的方差齐性进行检验。b. 采用学生t检验（Student's t-test）对假照射组与极低频电磁场照射组开展统计学差异评估。