Simulated shielding performance of 1296 four-layer permutations of six common satellite and radiation shielding materials against trapped particles on GTO

The 4Layer.csv file contains ionizing dose results of simulating the shielding performance of all 1296 four-layer permutations of six common satellite and radiation shielding materials against trapped particles on GTO.
The materials are the aluminium alloy 7075 (Al_7075), polyethylene (G4_POLYETHYLENE), kevlar (G4_KEVLAR), tungsten (G4_W), stainless steel (G4_STAINLESS_STEEL) and the circuit board composite material FR4 (FR4).
The particle spectra used for this simulation are provided in the files AE9500keV.mac and AP910MeV.mac.
The simulated geometry is provided in the file 4Layer.gdml.

The particle spectra were generated with the AE9/AP9 models on SPENVIS, with electron energies starting at 500 keV and proton energies starting at 10 MeV.
The simulation was performed with GRAS / Geant4 with the FTFP_BERT physics model using 6.6e+10 electrons and 3.8e+09 protons directed against slabs of shielding materials of 1.5 g/cm2 total depth with each of the four layers being 0.375 g/cm2 in depth.
The ionizing dose is recorded in 0.5mm thick silicon plates behind the shielding plates.

Column A: ID of the material combination
Column B: Name of the top layer material.
Column C: Name of the second layer material.
Column D: Name of the third layer material.
Column E: Name of the bottom layer material.
Column F: Ionizing dose due to electrons in units of kRad per month.
Column G: Absolute statistical error in the electron dose in kRad per month.
Column H: Ionizing dose due to protons in kRad per month.
Column I: Absolute statistical error in the proton dose in kRad per month. 
Column J: Total ionizing dose from electrons and protons in kRad per month.
Column K: Absolute statistical error in the total ionizing dose in kRad per month. 
Column L: Relative statistical error of the total ionizing dose in per cent.
Column M: Rank of the material combination sorted from lowest total ionizing dose to highest.
Column N: Rank of the material combination sorted from lowest electron dose to highest.
Column O: Rank of the material combination sorted from lowest proton dose to highest.

All dose values are rounded according to their uncertainty.

4Layer.csv 文件包含了针对地球同步转移轨道（Geostationary Transfer Orbit, GTO）上的捕获粒子，模拟六种常见卫星及辐射屏蔽材料的全部1296种四层排列组合的屏蔽性能所得到的电离剂量结果。

本次模拟涉及的材料包括7075铝合金（Al_7075）、聚乙烯（G4_POLYETHYLENE）、凯夫拉（Kevlar, G4_KEVLAR）、钨（G4_W）、不锈钢（G4_STAINLESS_STEEL）以及电路板复合材料FR4（FR4）。

本次模拟所使用的粒子能谱文件为AE9500keV.mac与AP910MeV.mac。

模拟所采用的几何结构文件为4Layer.gdml。

上述粒子能谱基于SPENVIS平台上的AE9/AP9模型生成，其中电子能谱的起始能量为500 keV，质子能谱的起始能量为10 MeV。

本次模拟基于GRAS/Geant4平台开展，采用FTFP_BERT物理模型，共入射6.6×10^10个电子与3.8×10^9个质子，靶屏蔽材料总厚度为1.5 g/cm²，四层结构每层厚度均为0.375 g/cm²。

电离剂量的测量位置为屏蔽板后方的0.5mm厚硅片。

表格各列说明如下：
A列：材料组合编号
B列：顶层材料名称
C列：第二层材料名称
D列：第三层材料名称
E列：底层材料名称
F列：电子引发的电离剂量，单位为kRad/月
G列：电子剂量的绝对统计误差，单位为kRad/月
H列：质子引发的电离剂量，单位为kRad/月
I列：质子剂量的绝对统计误差，单位为kRad/月
J列：电子与质子共同引发的总电离剂量，单位为kRad/月
K列：总电离剂量的绝对统计误差，单位为kRad/月
L列：总电离剂量的相对统计误差，单位为百分比
M列：按总电离剂量由低到高排序的材料组合排名
N列：按电子剂量由低到高排序的材料组合排名
O列：按质子剂量由低到高排序的材料组合排名

所有剂量值均根据其不确定度进行修约。