Atomic Data and Ionization State Distributions for Xe44+, Xe51+ and W64+ ions

The x-ray imaging crystal spectrometer (XICS) is proposed as the principal method of diagnostics for plasma ion temperature and rotation for the China Fusion Engineering Test Reactor (CFETR) for its simplicity in implementation and no reliance on neutral beams. For D–T experiments with the electron temperature as high as 35–40 keV at the core region, highly charged high-Z ions can serve as the diagnostic ions for the XICS. For the CFETR, Xe44+, Xe51+, and W64+ are selected as the impurity ions. This dataset includes the atomic data and the ionization state distribution data used in the article Design consideration of an x-ray imaging crystal spectrometer for China Fusion Engineering Test Reactor.

X射线成像晶体光谱仪（x-ray imaging crystal spectrometer，XICS）因实施简便且无需依赖中性束（neutral beams），被提议作为中国聚变工程实验堆（China Fusion Engineering Test Reactor，CFETR）诊断等离子体离子温度与旋转特性的主要诊断方法。对于等离子体核心区域电子温度高达35–40 keV的氘氚（D-T）实验，高电荷态高原子序数离子可作为XICS的诊断离子。针对CFETR，选定Xe44+、Xe51+及W64+作为杂质离子。本数据集包含《Design consideration of an x-ray imaging crystal spectrometer for China Fusion Engineering Test Reactor》一文中所用的原子数据与电离态分布数据。