一种测量纳米器件输运性质的系统和方法
收藏中国科学院中国科学技术大学科学数据中心2026-01-10 收录
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https://sdc.ustc.edu.cn/dataDetails/obUaOJYBQwfvTVc53-Mm
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资源简介:
本申请公开了一种测量纳米器件输运性质的系统和方法,利用FPGA性能高、I/O接口多和可重复配置的优点,控制数据转换单元输出信号并采集信号,对纳米器件进行控制和读出,以测量和表征纳米器件的输运性质,其是一种集成度高、多通道、具有高精度和低噪声优点的系统。
This application discloses a system and method for measuring the transport properties of nanodevices. Leveraging the advantages of FPGA, including high performance, abundant I/O interfaces and reconfigurability, the system controls the data conversion unit to output and collect signals, as well as regulates and reads out nanodevices, so as to measure and characterize their transport properties. This is a high-integration, multi-channel system with high precision and low noise.
提供机构:
上海寒武纪信息科技有限公司
创建时间:
2023-05-23



