Structural characterization of chromium oxide coating using XRD

The raw data were generated with Siemens D5000 X-ray Diffractometer using Diffrac plus XRD commander software supplied with the machine原始数据由西门子（Siemens）D5000型X射线衍射仪（X-ray Diffractometer）生成，实验过程中使用了该设备随附的Diffrac Plus XRD Commander软件。