Mapping the Rare Earth Magnetization profile in designed compositionally-graded GdCoFe ferrimagnetic alloy films for spintronic applications.

This experiment aims to map the local variations of Gd magnetization profile through the thickness of GdFeCo ferrimagnetic films with a deliberately designed Gd variation through the film thickness. Hard X-ray resonant dichroism and magnetic reflectivity (XRMR) at the Gd L3 edge (7.24 keV) will be used to map the Gd magnetization profile through the film thickness. Temperature dependent XRMR measurements through compensation, combined with SIMS and SQUID magnetometry, will enable us to understand the evolution of the global and local compensation behaviour. This approach offers a comprehensive understanding of magnetization behaviour arising from compositional non-uniformities and their influence on the evolution of ferrimagnetic compensation in RE:TM alloys for spintronics.

本实验旨在针对膜厚方向钆（Gd）组分经刻意调控的GdFeCo亚铁磁薄膜，绘制其沿膜厚分布的局域钆磁化强度剖面变化。基于钆L3吸收边（7.24 keV）处的硬X射线共振二向色性与磁反射技术（XRMR），可实现沿膜厚方向的钆磁化强度剖面测绘。结合二次离子质谱（SIMS）与超导量子干涉仪（SQUID）磁强计测量，对补偿区间内的温度依赖性XRMR测试，将帮助我们明晰全局与局域补偿行为的演化规律。该研究方法可全面揭示由组分不均匀性引发的磁化行为，及其对自旋电子学领域稀土-过渡金属（RE:TM）合金中亚铁磁补偿演化过程的影响。