Multiple serial sectional inclusion SEM analysis of a ladle sample and a tundish sample from the same heat
收藏kilthub.cmu.edu2021-08-18 更新2025-01-22 收录
下载链接:
https://kilthub.cmu.edu/articles/dataset/Multiple_serial_sectional_inclusion_SEM_analysis_of_a_ladle_sample_and_a_tundish_sample_from_the_same_heat/14755143/1
下载链接
链接失效反馈官方服务:
资源简介:
Two separate files are included in this dataset. They are a compilation of multiple cross-sectional SEM inclusion analyses of the same area, for 2 samples. Both samples are from the same heat, one from the lade metallurgy furnace (LMF) and the other from the tundish. The SEM analysis was carried out at Carnegie Mellon University using a Thermo Fisher / FEI Aspex Explorer, at 10 kV accelerating voltage. The data is filtered to remove non-inclusions (pores and erroneous readings). For each sample, a specified area was marked and analyzed in the SEM. Then the surface was polished to remove several micrometers and reanalyzed again in the SEM. This process was reiterated to obtain multiple serial sections (i.e. 3D inclusion distribution). Five serial sections were analyzed for the LMF sample, and six for the tundish sample. Inclusions' z coordinate was calculated based on the amount of material removed between sections.
本数据集包含两份独立文件。这两份文件是对同一区域进行的多项横截面扫描电子显微镜(SEM)分析结果的汇编,针对两个样本。两个样本均取自同一热处理过程,其中一份源自拉尔德金属冶炼炉(LMF),另一份则来自浇包。SEM分析工作于卡内基梅隆大学完成,采用赛默飞世尔/飞利浦Aspex Explorer扫描电镜,在10千伏的加速电压下进行。数据经过滤波处理,以移除非夹杂物(如孔隙和错误读数)。对于每个样本,指定区域被标记并进行SEM分析。随后,对表面进行抛光处理以去除数微米厚的材料,并再次进行SEM分析。此过程被反复执行,以获得多个连续切片(即三维夹杂物分布)。对于LMF样本,分析了五个连续切片,而对于浇包样本,则分析了六个连续切片。夹杂物在空间中的Z坐标是根据切片间去除材料量的多少进行计算的。
提供机构:
Carnegie Mellon University



