25GDFB芯片高温老化数据
收藏国家基础学科公共科学数据中心2024-03-05 收录
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资源简介：
激光器老化测试系统是由Newport公司生产的LRS 9434，可实现每个夹具单独控温和单独加电，具体方法为，将芯片的N面和过渡块和TO底座通过贴片工艺进行贴合，再利用金丝键合工艺将芯片的P面金属电极和过渡块的金属上表面进行键合，使其达到P和N面金属在过渡块上形成共面电极，最后封帽完成TO封装。
The laser aging test system refers to the LRS 9434 manufactured by Newport Corporation, which allows independent temperature control and independent power supply for each fixture. Specifically, the N-side of the chip is bonded to the transition block and the TO base through the die attach process. Subsequently, gold wire bonding is used to bond the metal electrode on the P-side of the chip to the metallic upper surface of the transition block, thereby enabling the metals on the P-side and N-side of the chip to form coplanar electrodes on the transition block. Finally, capping is conducted to complete the TO package.
提供机构：
武汉光迅科技股份有限公司
