Synchrotron X-ray Diffraction Dataset - Measuring Bulk Crystallographic Texture from Differently-Orientated Ti-6Al-4V Samples

A dataset of raw synchrotron X-ray diffraction (SXRD) images, recording crystallographic texture from two different pre-processed Ti-6Al-4V (Ti-64) materials, analysing six differently orientated samples from each material. The aim of the work was to provide a large dataset for testing and improving crystallographic texture refinement software from SXRD patterns. Prior to the experiment, the Ti-64 materials had been pre-rolled and then air-cooled to develop the microstructure, rolling to 50% and 87.5% reduction at 915ºC using a rolling mill at The University of Manchester. Rectangular samples (2 mm thick) were then machined from these rolled blocks. The samples were cut along different directions, three samples along different orthogonal rolling directions, and three at different angles to the rolling directions. The samples are referenced according to alignment of the rolling directions (RD – rolling direction, TD – transverse direction, ND – normal direction) with the long horizontal (X) axis and short vertical (Y) axis of the rectangular specimens. Data was recorded using a high energy 99.8 keV synchrotron X-ray beam and a 5 second exposure at the detector. The slits were adjusted to give a 0.5 x 0.5 mm beam area, chosen to optimally resolve both the α (hexagonal close packed, hcp) and β (body-centred cubic, bcc) phase peaks. The SXRD data was recorded across each of the specimens by stage-scanning the beam in sequential X-Y positions at 0.5 mm increments, forming a rectangular grid of measurement points across each sample. A powder Ti-64 sample was also measured as a random texture standard. As well as the main experiment, 3 samples (sample 1, 2 and 3) were held together in different orders (1, 2, 3 ; 2, 1, 3 ; 2, 3, 1) and analysed through-thickness, to measure how beam attenuation might affect the bulk texture measurement. In addition, different detector exposure times (1 to 0.04 seconds) were also tested to analyse the impact of exposure time on overall intensity, to see how well the α and β peaks could be resolved from background noise at very fast acquisition frequencies. The raw data is in the form of synchrotron diffraction pattern images which has been separated according to experiment type. An accompanying YAML text file contains associated beamline metadata for each measurement. Further details of the experimental setup can be found in a pdf document. The material data folder contains further details about the material and sample orientations, including an electron backscatter diffraction (EBSD) map that can be used to verify the crystallographic texture.本数据集包含原始同步辐射X射线衍射（synchrotron X-ray diffraction, SXRD）图像，记录了两种不同预处理工艺制备的Ti-6Al-4V（简称Ti-64）合金的晶体织构，每种材料选取6个不同取向的试样开展分析。本数据集的构建目标是提供大规模数据集，用于测试并优化基于SXRD图谱的晶体织构精修软件。实验前，两种Ti-64合金均经预轧制后空冷以形成微观组织：在曼彻斯特大学的轧机上于915℃下分别完成50%和87.5%的压下率轧制。随后从轧制坯料上加工出厚度为2mm的矩形试样。试样沿不同方向切割：3个试样沿正交轧制方向切割，剩余3个与轧制方向呈不同夹角。试样的命名依据轧制方向与矩形试样长横轴（X轴）、短纵轴（Y轴）的对齐关系，具体对应轧制方向（rolling direction, RD）、横向（transverse direction, TD）及法向（normal direction, ND）。数据采集采用能量为99.8 keV的高能同步辐射X射线束，探测器曝光时长为5秒。狭缝经调节后光束面积为0.5×0.5 mm，以最优分辨率同时解析α相（六方最密堆积，hexagonal close packed, hcp）与β相（体心立方，body-centred cubic, bcc）的衍射峰。通过以0.5mm为步长在X-Y方向逐点扫描光束，完成每个试样的全区域数据采集，最终在每个试样表面形成矩形网格状的测量点分布。同时还采集了粉末态Ti-64试样的数据，作为随机织构标准样品。除主实验外，研究人员还将试样1、2、3以三种不同排列顺序（1, 2, 3 ; 2, 1, 3 ; 2, 3, 1）组合，沿厚度方向开展分析，以探究光束衰减对整体织构测量结果的影响。此外，研究人员还测试了1秒至0.04秒范围内的不同探测器曝光时长，以分析曝光时间对整体衍射强度的影响，探究在极快采集频率下α相与β相衍射峰从背景噪声中解析的效果。原始数据为同步辐射衍射图谱图像，已按实验类型分类存储。配套的YAML文本文件包含了每项测量的光束线元数据。实验装置的更多细节可参阅附带的PDF文档。材料数据文件夹包含了材料与试样取向的更多细节，其中包括可用于验证晶体织构的电子背散射衍射（electron backscatter diffraction, EBSD）图谱。