IODP Expedition 396 X-ray fluorescence (XRF)

Elemental peak intensities in section halves were measured by an Avaatech X-ray fluorescence (XRF) Core Scanner postexpedition. Each measurement position may be measured at multiple XRF conditions in order to excite and measure specific ranges of elements (e.g., 10 kV and no filter for light elements). Peak intensity changes (concentrations not provided) are then used to help recognize and define major chemostratigraphic units without the need for destructive sampling. Data are presented in comma-delimited (CSV) files by section and by energy/instrumental conditions.

岩芯半段的元素峰强度由Avaatech X射线荧光（XRF）岩芯扫描仪于航次后进行测量。每个测量位置可在多种XRF条件下完成测量，以激发并测定特定范围的元素，例如针对轻元素采用10 kV电压且无滤光片的测试条件。随后借助峰强度变化（未提供元素浓度数据），可在无需破坏性采样的前提下识别并划定主要的化学地层单元。数据按岩芯段以及能量/仪器条件整理为逗号分隔值（CSV）文件进行呈现。