Research Data Supporting "Kinetics of spinodal decomposition, metastable ordering, and discontinuous precipitation in Cu‑15Ni‑8Sn"
收藏DataCite Commons2025-10-16 更新2026-01-12 收录
下载链接:
https://www.repository.cam.ac.uk/handle/1810/390974
下载链接
链接失效反馈官方服务:
资源简介:
Zip folder containing synchrotron X-ray diffraction patterns (.xye files), scanning electron microscopy and scanning transmission electron microscopy images (.png files), and atom probe tomography measurements (.csv files) associated with a study of the ageing response of Cu-15Ni-8Sn (wt%). Diffraction patterns were collected from the ID22 beamline at the European Synchrotron Radiation Facility at room temperature and during thermal exposures as described in the file names. Data are partitioned into bins of 0.002 degrees. Scanning electron microscopy images were collected in backscattered electron mode, along with corresponding energy dispersive X-ray elemental intensity maps with an acceleration voltage of 20 kV. Scanning transmission electron microscopy images and corresponding energy dispersive X-ray elemental intensity maps were acquired with an acceleration voltage of 200 kV. Atom probe tomography data are presented as radial concentration profiles from reference Ni atoms.
本压缩包包含与Cu-15Ni-8Sn(质量百分比)合金时效响应研究相关的多类实验数据集,具体涵盖同步辐射X射线衍射(synchrotron X-ray diffraction)图谱(.xye格式文件)、扫描电子显微镜(scanning electron microscopy, SEM)及扫描透射电子显微镜(scanning transmission electron microscopy, STEM)图像(.png格式文件),以及原子探针层析成像(atom probe tomography, APT)测试数据(.csv格式文件)。相关衍射图谱采集自欧洲同步辐射光源(European Synchrotron Radiation Facility, ESRF)的ID22光束线,测试条件涵盖室温及热暴露工况,具体信息可参见文件名;所有衍射数据按0.002度的步长完成分箱处理。扫描电子显微镜图像采用背散射电子模式采集,并配套获取对应能量色散X射线(energy dispersive X-ray, EDX)元素强度分布图,测试加速电压为20 kV。扫描透射电子显微镜图像及对应能量色散X射线元素强度分布图的采集加速电压为200 kV。原子探针层析成像数据以基于参考Ni原子的径向浓度分布形式呈现。
提供机构:
Apollo - University of Cambridge Repository
创建时间:
2025-10-15



