Angle-resolved optical spectroscopy data on MePTCDI/hBN: experiments and simulations

angle_resolved_spectroscopy.hdf5: contains experimental angle-resolved reflectivity and photoluminescence measurements carried out at the SupraFAB building, Freie Universität Berlin, for MePTCDI molecules grown on hBN flakes of different thicknesses. For the angle-resolved reflectivity data, simulations corresponding to the experimental parameters are also included. angle-resolved photoluminescence data of MePTCDI on hBN flakes for five thicknesses. For the 45 nm flake, additional polarization-resolved data are available (Figure 3 in the corresponding paper) angle-resolved reflectivity data of MePTCDI on hBN flakes for five thicknesses: experiments and corresponding simulated spectra simulations_angle_resolved_reflectivity.hdf5: contains simulated angle-resolved reflectivity data carried out using the PyGTM code (https://pygtm.readthedocs.io/en/latest/), based on Passler, N. C. and Paarmann, A., JOSA B 34, 2128 (2017) 10.1364/JOSAB.34.002128. calculated hBN thickness dependence of the p-polarized angle-resolved reflectivity spectra, for a fixed SiO2 thickness of 290 nm calculated SiO2 thickness dependence of the p-polarized angle-resolved reflectivity spectra, for a fixed hBN thickness of 121 nm additional hBN thickness dependence of the p-polarized angle-resolved reflectivity spectra, focusing on a "sharp feature" appearingangle_resolved_spectroscopy.hdf5：包含在柏林自由大学SupraFAB实验室开展的实验性角分辨反射率与光致发光测量数据，测试对象为生长于不同厚度六方氮化硼（hBN）薄片上的MePTCDI分子。针对角分辨反射率数据，本数据集还附带了与实验参数匹配的模拟结果。 针对五种厚度六方氮化硼（hBN）薄片上的MePTCDI样品，本数据集包含其角分辨光致发光数据；其中厚度为45 nm的六方氮化硼（hBN）薄片样品还额外提供了偏振分辨数据（对应相关论文中的图3） 针对五种厚度六方氮化硼（hBN）薄片上的MePTCDI样品，本数据集包含其角分辨反射率数据，涵盖实验测量结果与对应的模拟光谱。 simulations_angle_resolved_reflectivity.hdf5：包含使用PyGTM代码（https://pygtm.readthedocs.io/en/latest/）生成的模拟角分辨反射率数据，该代码基于Passler, N. C. 与Paarmann, A.发表于《JOSA B》第34卷第2128页（2017年，DOI: 10.1364/JOSAB.34.002128）的研究工作。 针对固定二氧化硅（SiO₂）厚度为290 nm的样品，本数据集包含计算得到的p偏振角分辨反射率光谱随六方氮化硼（hBN）厚度的变化关系。 针对固定六方氮化硼（hBN）厚度为121 nm的样品，本数据集包含计算得到的p偏振角分辨反射率光谱随二氧化硅（SiO₂）厚度的变化关系。 额外提供p偏振角分辨反射率光谱随六方氮化硼（hBN）厚度的变化关系数据，重点聚焦于其中出现的"sharp feature"（锐化特征）。