Furan flanked diketopyrrolopyrrole dithienothiophene (PDPPF-DTT) material based Organic Field Effect Transistors (OFET)

This dataset is the result of an Electrode and dielectric layer interface device engineering study using furan flanked diketopyrrolo pyrrole–dithienothiophene, polymer based organic transistors. Researchers successfully demonstrated a detailed and systematic enhancement of OFETs performance using PDPPF-DTT as an active semiconductor. The data provided includes the measurements, and AFM data, with original plots for XRD.

The attached data files include: 1x folder of many excel sheets with original raw data for each of OFET configurations; 1x folder of segregated OFET data with calculated, and average data’s; 10 AFM images with roughness averaging data; 1 world file with XRD original XRD plot. File formats or material types are: .doc, .xls and .jpeg.

Hardware used includes: Keithley 4200-SCS semiconductor parameter analyser, Bruker AFM analyser, and Rigaku Smart-Lab (CuKα Long Fine Focus Tube working at 40 kV 40 mA) in Grazing Incident Diffraction (GID) geometry.

本数据集系采用含氟化二酮吡咯并吡咯噻二嗪-二噻吩并噻二嗪，基于聚合物有机晶体管的电极与介电层界面工程研究之成果。研究人员成功展示了利用PDPPF-DTT作为活性半导体的有机场效应晶体管（OFETs）性能的详细且系统性的提升。所提供数据包括测量数据、原子力显微镜（AFM）数据，以及X射线衍射（XRD）的原始绘图。附带的数据文件包括：一个包含多个Excel工作表的原生原始数据文件夹，每个文件夹对应OFET配置的不同配置；一个包含计算数据和平均数据的OFET数据文件夹；10张AFM图像及其粗糙度平均值数据；一个包含XRD原始绘图的世界文件。文件格式或材料类型为：.doc、.xls和.jpeg。所使用的硬件包括：基思利仪器公司（Keithley）4200-SCS半导体参数分析仪、布鲁克（Bruker）AFM分析仪，以及里氏公司（Rigaku）Smart-Lab（CuKα长焦聚焦管，工作于40 kV 40 mA）在 Grazing Incident Diffraction（GID）几何构型下。