Tomography Data for: Three-dimensional Nanoscale Metal, Metal Oxide and Semiconductor Frameworks through DNA-programmable Assembly and Templating

This is data collected at the 3-ID Hard X-ray Nanoprobe beamline. This repository supports the following research article: Data provided is the aligned dataset and reconstruction using a FISTA algorithm. Angles Collected -90 to +45 at 1 degree steps. Three-dimensional Nanoscale Metal, Metal Oxide and Semiconductor Frameworks through DNA-programmable Assembly and Templating By Aaron Michelson.本数据集采集自3-ID硬X射线纳米探针光束线（3-ID Hard X-ray Nanoprobe beamline）。本数据仓库配套支持以下研究论文： 本次提供的数据为经快速迭代收缩阈值（FISTA）算法对齐后的数据集与重建结果。 采集角度范围为-90°至+45°，步长为1°。 论文标题：《基于DNA可编程组装与模板法的三维纳米级金属、金属氧化物及半导体框架》 作者：艾伦·米歇尔森（Aaron Michelson）