High-precision X-ray polarimeter based on channel-cut crystals

The raw data submitted covers all the data required in the paper from Fig. 2 to Fig. 5, and is divided into two forms: text document in "dat" format and picture in "tif" format. The specific treatment methods of each set of raw data are as follows:Fig. 2(b) was a direct plot from the raw data fig2(b)_001 and fig2(b)_002, with coordinates corrected for detector gain and motor resolution;Fig. 2(c) was a direct display of the raw data fig2(c)_001 and fig2(c)_002;Fig. 3(b) and Fig. 3(c) were direct displays of the raw data fig3(b) and fig3(c);Fig. 2(b) was a direct plot from the raw data fig4(b), with coordinates corrected for detector gain and motor resolution;Fig. 4(c) was a direct plot from the raw data fig4(b)_001-fig4(c)_007, with coordinates corrected for detector gain and motor resolution;Fig. 5(b) was a direct display of the raw data fig5_001-fig5_021, in which the image position was calibrated according to the detector position, and the image intensity was normalized to the integration time;Each data point in Figure 5(c) is derived from the integration of the intensity of each light spot in Figure 5(b) and normalized by incident light intensity;The inner graph in Fig.5(c) was a direct plot from the raw data fig5in_001 and fig5in_002, with coordinates corrected for detector gain and motor resolution.All data were collected and saved at the BL09B X-ray test beamline of the Shanghai Synchrotron Radiation Facility(SSRF) and the collection date was November 2022.

本次提交的原始数据涵盖了论文中图2至图5所需的全部数据，分为dat格式文本文档与tif格式图像文件两种形式。各组原始数据的具体处理方式如下：图2(b)直接基于原始数据fig2(b)_001与fig2(b)_002绘制而成，其坐标已针对探测器增益与电机分辨率进行校正；图2(c)直接展示原始数据fig2(c)_001与fig2(c)_002的内容；图3(b)与图3(c)直接展示原始数据fig3(b)与fig3(c)的内容；图2(b)直接基于原始数据fig4(b)绘制而成，其坐标已针对探测器增益与电机分辨率进行校正；图4(c)直接基于原始数据fig4(b)_001至fig4(c)_007绘制而成，其坐标已针对探测器增益与电机分辨率进行校正；图5(b)直接展示原始数据fig5_001至fig5_021的内容，其中已根据探测器位置对图像位置进行校准，并将图像强度按照积分时间进行归一化处理；图5(c)中的每个数据点均由图5(b)中各光斑的强度积分得到，并以入射光强度进行归一化处理；图5(c)中的内嵌图直接基于原始数据fig5in_001与fig5in_002绘制而成，其坐标已针对探测器增益与电机分辨率进行校正。所有数据均于2022年11月在上海同步辐射光源（Shanghai Synchrotron Radiation Facility, SSRF）BL09B X射线测试光束线上采集并保存。