Materials Experiment and Analysis Database: X-ray diffraction measurements containing 1 files performed on plate containing Cu,V,Ar,O annealed at 550.0C to add O on 2014-12-02 from Run 20141201.202447
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Files available via S3 at https://renc.osn.xsede.org/ini210004tommorrell/0_gregoire/<br>20141201.202447.copied-20161216223042157PST.zip <a class="btn btn-xs piwik_download" type="application/octet-stream" href="https://renc.osn.xsede.org/ini210004tommorrell/0_gregoire/yqt1-tm05/20141201.202447.copied-20161216223042157PST.zip"> <i class="fa fa-download"></i> Download</a> <br>
本数据集文件可通过S3存储服务获取,基础访问路径为:https://renc.osn.xsede.org/ini210004tommorrell/0_gregoire/<br>目标文件名为20141201.202447.copied-20161216223042157PST.zip,可通过以下下载入口获取:<a class="btn btn-xs piwik_download" type="application/octet-stream" href="https://renc.osn.xsede.org/ini210004tommorrell/0_gregoire/yqt1-tm05/20141201.202447.copied-20161216223042157PST.zip"><i class="fa fa-download"></i> 下载</a><br>



