Replication Data for: A statistical characterization of dielectric breakdown ...

This dataset contains the results of Ramped Voltage Stresses (Ig-Vg curves) applied to induce the BD of the gate stack of FDSOI nanowire transistors, together with the...本数据集包含为诱导全耗尽绝缘体上硅（FDSOI）纳米线晶体管栅极叠层击穿（BD，Breakdown）所施加的斜坡电压应力（Ramped Voltage Stresses）的测试结果（即栅极电流-栅极电压曲线（Ig-Vg curves）），以及……