Remote Calibration Data for High-Speed Detectors from the Institute of Microelectronics, Chinese Academy of Sciences (IMECAS)

At three testing temperature points of -20 ℃, -80 ℃, and -150 ℃, the pulse laser testing method was used to test the time resolution of the silicon drift detector. At each temperature point, no less than 1000 sets of trigger signals t0 and detector response signals t were measured for the time difference (△ t=t-t0). The Gaussian distribution FWHM formed by fitting △ t is the time resolution of the detector.