Surface-Topography Challenge_Sample P37
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资源简介：
Tapping and contact mode AFM images with different scan sizes on the respective sample P37 (rougher surface-CrN deposited on the rough "backside" of a single-side polished silicon wafer, which has been subsequently etched with isotropic reactive ion etching).
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contact.engineering创建时间：
2025-04-28
