Simulations of X-ray emission spectra
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资源简介：
Results of simulating X-ray emission spectra using NIST DTSA-II software, in order to investigate the influence of secondary fluorescence on the microanalysis of semiconductor layers. The methodology is outlined and the results analysed in the associated Microscopy and Microanalysis paper by D. A. Hunter et al. (2022).
创建时间：
2023-06-28
