Dataset used by the paper: Wu, Ming-Ju, Jyh-Shing R. Jang, and Jui-Long Chen. “Wafer Map Failure Pattern Recognition and Similarity Ranking for Large-Scale Data Sets.” IEEE Transactions on Semiconduct
This dataset contains 1050 multi-pattern multi-bin wafer bin maps (WBMs) synthesized from WM-811K binary WBM dataset and real world multi-bin WBMs using a trained pix2pix model.
We propose to continue laser spectroscopy measurements of the muonium (Mu-) centres in n-type doped silicon carbide. Scanning a wide wavelength range, and changing the relative...
The dataset is a self-constructed wafer surface defect dataset, with each image captured in real-time. The extraction and segmentation of wafer image have been performed, and each image represents a s
Data used in the article "Hybrid-DFT study on the formation energies of donor and acceptor N impurities in β-Ga2O3" by A. Shokri, Y. Melikhov, Y. Syryanyy, I.N. Demchenko. First-principles density fun
