Tapping and contact mode AFM images with different scan sizes on the respective sample A34 (smoother surface-CrN deposited on a prime-grade polished silicon wafer).

DataCite Commons2025-04-28 更新60

Surface-Topography Challenge_Sample P38

Tapping and contact mode AFM images with different scan sizes on the respective sample P38 (rougher surface-CrN deposited on the rough "backside" of a single-side polished silicon wafer, which has bee

DataCite Commons2025-04-28 更新50

Surface-topography challenge (Sample A71)

Atomic force microscopy (AFM) topography images of a chromium nitride (CrN) sample deposited on a prime-grade polished silicon wafer. Six measurements are included with scan sizes of respectively 0.51

DataCite Commons2025-02-10 更新30

Surface-Topography Challenge_Sample A33