Data for "Even-Odd Layer-Dependent Exchange Bias Effect in MnBi2Te4 Chern Insulator Devices"
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资源简介：
Raw data for "Even-Odd Layer-Dependent Exchange Bias Effect in MnBi2Te4 Chern Insulator Devices". These are all the data in the main text and the supplementary materials. The opj files are the processed Origin data.
创建时间：
2025-04-16
