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AFM形貌成像实验
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2023-05-31
相关数据集
Polished surface - Sample ID A31
An XE-100 atomic force microscope (AFM, Park Systems) was used in contact mode with a NSC36C cantilever (Park Systems). The cantilever had a force constant of 0.6 N/m, resonant frequency of 65 kHz, le
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Optical Contact Angle Meter Market
Report of Optical Contact Angle Meter Market is covering the summarized study of several factors encouraging the growth of the market such as market size, market type, major regions and end user appli
IMR REPORTS10
Atomic force microscopy (AFM) images of DNA origami rectangles
AFM images of bare DNA origami rectangles on mica that were assembled at different staple excess (2x to 10x). Images .jpk were recorded in air using a JPK Nanowizard Ultra Speed (JPK Instruments) oper
Zenodo2025-07-16 更新00
Part 2 of August 2002 LTSTM data set.
This is the second part of the August 2002 low temperature STM data set.
Figshare2016-01-19 更新40
Analýza morfologie a stavu povrchové vrstvy vzorků z Albromet W130
Analýza morfologie a stavu povrchové vrstvy pomocí elektronové mikroskopie vzorků z Albromet W130, vyrobených v rámci screeningového plánovaného experimentu (60 kol).
Zenodo2023-06-17 更新00
