Results of simulating X-ray emission spectra using NIST DTSA-II software, in order to investigate the influence of secondary fluorescence on the microanalysis of semiconductor layers. The methodology
Microscopic data on airborne particle separation in depth filters are a key for understanding and predictive modeling of the evolution of filtration properties such as pressure drop and efficiency dur
The quantitative data relating to the derived collagen fibril diameter from TEM images of the respective age groups are contained in a MS Excel file, strucprop.xls The file contains the following w
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