Accelerated Aging Platform for Prognostics of Power Electronics

NASA Open Data Portal2025-06-21 收录

功率半导体可靠性

故障预测与健康管理

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https://data.nasa.gov/dataset/accelerated-aging-platform-for-prognostics-of-power-electronics 数据链接链接失效反馈

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资源简介：

To advance the field of electronics prognostics, the study of transistor fault modes and their precursors is essential. This paper reports on a platform for the aging,...

Data underlying the PhD dissertation 'Prognostics and Thermal Management of Power Electronic Packages'

功率半导体可靠性

电子封装热管理

The reliability of power electronic packages is often compromised by degradation mechanisms such as thermal fatigue and delamination, leading to economic consequences due to premature failures. Conven

DataCite Commons2024-10-31 更新70

OX04

功率半导体可靠性

宇宙辐射失效分析

High-voltage power semiconductor devices, such as IGBTs, diodes and MOSFETs are susceptible to destructive failure due to terrestrial cosmic radiation (CR), notably the nucleon...

B2FIND30

工业互联网平台运行日志与调度管理数据集

工业设备监控

故障预测与健康管理

核心规则：接入与标准化：支持多数据库、工业协议接入，统一编码、指标、时间格式及数据分类。清洗与脱敏：规范缺失值、重复值处理，对企业敏感信息脱敏，确保数据准确安全。更新与维护：按年度更新数据，定期校验，建立版本管理与维护台账。核心算法：多源数据融合：改进加权模型，实现多类型数据对齐、融合，适配企业计算资源有限场景。异常识别与修正：双重模型识别数值、趋势异常，分类处理确保数据准确。

贵州省数据知识产权登记平台2026-05-08 更新20

Improved Prediction Model of Ion-Induced Worst-Case Response in Power Devices

单粒子效应

功率半导体可靠性

This study investigates the worst-case Single-Event Effect (SEE) response in semiconductorpower devices induced by energetic ions. An existing predictive model is refined and extended to potentiallyco

IEEE50

SEB Step Current Characteristic of GaN HEMTs

功率半导体可靠性

单粒子烧毁效应

Single-event burnout (SEB) experiments conducted on enhancement-mode GaN HEMTs, together with current measurements using a Keysight 34461A digital multimeter, revealed a new “step current” SEB charact

DataCite Commons2025-12-01 更新20

Accelerated Aging Platform for Prognostics of Power Electronics

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