Temperature dependent XMCD of CCO thin films

Name: Temperature dependent XMCD of CCO thin films
Creator: Institut Laue-Langevin - ILL,CS 20156,38042 GRENOBLE Cedex 9,FRANCE,38042,GRENOBLE,FRANCE; ESRF,CS 40220,38043 GRENOBLE Cedex 9,FRANCE,38043,GRENOBLE,FRANCE
Published: 2027-01-01T00:00:00+08:00

ESRF Portal2027-01-01 更新2026-04-23 收录

磁性薄膜表征

自旋重取向转变

数据链接：

https://doi.esrf.fr/10.15151/ESRF-ES-1911915195 数据链接链接失效反馈

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资源简介：

Bulk CCO undergoes a spin reorientation transition at 29K. Such a transition has yet to be characterized in thin films. We will measure XMCD of the magnetic cations as a function of temperature.

提供机构：

Institut Laue-Langevin - ILL,CS 20156,38042 GRENOBLE Cedex 9,FRANCE,38042,GRENOBLE,FRANCE; ESRF,CS 40220,38043 GRENOBLE Cedex 9,FRANCE,38043,GRENOBLE,FRANCE

创建时间：

2027-01-01