Data File 4: Determination of optical constants including surface characteristics of optically thick nanostructured Ti films: analyzed by spectroscopic ellipsometry
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资源简介：
Correlation values between the surface roughness, thickness & volume fraction of oxide/Ti EMA layer and Drude & Lorentz coefficients for the sample T4~900 nm. Originally published in Applied Optics on 10 October 2016 (ao-55-29-8368)
创建时间：
2017-04-28
