Research data for "Influence of GaN substrate miscut on the XRD quantification of plastic relaxation in InGaN" published in Acta Materialia vol 276, 120082 (2024)

Name: Research data for "Influence of GaN substrate miscut on the XRD quantification of plastic relaxation in InGaN" published in Acta Materialia vol 276, 120082 (2024)
Creator: Institute of High Pressure Physics
Published: 2024-10-11T09:36:54+08:00

RepOD Repository for Open Data2024-10-11 更新2026-07-23 收录

InGaN塑性弛豫

XRD定量分析

数据链接：

https://repod.icm.edu.pl/dataset.xhtml?persistentId=doi:10.18150/ZYX2FD 数据链接链接失效反馈

官方服务：

资源简介：

Smalc-Koziorowska, Julita, 2024, "Research data for "Influence of GaN substrate miscut on the XRD quantification of plastic relaxation in InGaN" published in Acta Materialia vol 276, 120082 (2024)", https://doi.org/10.18150/ZYX2FD, RepOD, V1

提供机构：

Institute of High Pressure Physics

创建时间：

2024-10-11