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资源简介：
Arista Networks SEU testing
阿瑞斯塔网络（Arista Networks）单粒子翻转（Single Event Upset，SEU）测试
应用场景：
相关数据集
Single- and Multibit Measurements of recent technology nodes
Measurements of single-event upsets in recent semiconductor technology nodes.
B2FIND90
Reliability of Modern Microelectronics in Space and Terrestrial Radiation Environments
The objective of this proposal is to perform a series of Single Event Upsets (SEU) characterisations within space weather environments for modern microelectronics i.e. Commercial Off The Shelf SRAM Me
DataCite Commons2020-09-17 更新40
The reliability of modern microelectronics from mono-energetic neutrons compared to an atmospheric neutron spectra.
The objective of this proposal is to perform a series of Single Event Upsets characterisations for modern microelectronics i.e. commercial SRAM memories with feature sizes <90 nm which are analogou
DataCite Commons2025-07-09 更新30
Single Event Upset Data 2017-08 till 2018-05
Single Event Upset Data with Position Data used in "Single Event Upsets in flight observation and analysis for the “Flying Laptop” small satellite". Data measured by the FLP...
B2FIND60
The dataset for performance of SEU Rate Calculation Using In-Flight Proton Detection on daily and 6-hour scale
This dataset is calculated using three Single event upset rates based on on-orbit particle detection data and compared to the monitored SEU rates. A description of the associated methodology has been
科学数据银行2025-01-06 更新30
