Thermal cycling of a fully operable HgCdTe IR sensor using FFDXM

We propose to study the effect of multiple thermal cycling on the structure of the HgCdTe pixels using DFXM and micro-Laue experiments. In this follow-up experiment, we would like to statistically investigate the strain and orientation fluctuations in hundreds of pixels over multiple temperature cycles using DFXM, and correlate the strain states to the crystallographic orientation of the corresponding In bumps using micro-Laue experiment on the exact same sensor.