Deciphering the Critical Role of the CNT-Binder Interface in the Stress-Tolerant Capability of Si Anodes

OPEN TO READ (NOT CC BY LICENSE) Qitao Shi, Luwen Li, Zhipeng Wang, Cheng Zhang, Wenting Luo, Wujun Zhang, Jun Ge, Hui Shao, Mark H. Rümmeli, Yanbin Shen, and Liwei Chen. Deciphering the Critical Role of the CNT-Binder Interface in the Stress-Tolerant Capability of Si Anodes. ACS Applied Materials & Interfaces 2025 17 (39), 55606-55614. DOI: 10.1021/acsami.5c13573 Dataset description: Only metadata for the review paper above, as it is Open Access TO READ (not to share), it is not CC BY licence, Copyright(C) 2025 American Chemical Society. Although the EBEAM project funded by the EU is acknowledged among other funding sources, the project data manager and the data steward cannot upload any research data relevant to this paper that should be shared via a trusted repository, nonetheless. If the ERA Chair (contact person) changes the license, it will be included as a higher version on ZENODO. Furthermore, it has not transferred any research data for this Chinese research. Funding: This work was financially supported by the National Key R&D Program of China (2021YFB3800301), the National Natural Science Foundation of China (Grant no. 22179143), and the Jiangsu Funding Programme for Excellent Postdoctoral Talent. The authors are grateful for the technical support for Nano-X from the Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences (SINANO). M.H.R. thanks the National Natural Science Foundation of China (Grant No. 52071225) and the European Union’s Horizon Europe research and innovation program under grant agreement no. 101087143 (Electron Beam Emergent Additive Manufacturing (EBEAM)) under the REFRESH − Research Excellence For Region Sustainability and High-tech Industries (project no. CZ.10.03.01/00/22_003/0000048) via an operational program transition.