XRD file presenting phase purity of the SiC wick material
收藏数据链接：
官方服务：
资源简介：
A file presents X-ray diffraction (XRD) analysis in the 10–90° range to verify the phase purity of the wick material. The measurements were performed on the exposed surface of the cylindrical sample. The XRD diffractogram of the SiC sample was measured in an air atmosphere. This research was supported by National Science Centre grant OPUS no. UMO-2022/47/B/ST8/01490
创建时间：
2025-02-04
