Effects of pulsed and continuous light and heavy ion irradiation on the morphology and electrical properties of Ag+C60 and Au+C60 composite thin films

Dataset for the manuscript Effects of pulsed and continuous light and heavy ion irradiation on the morphology and electrical properties of Ag+C60 and Au+C60 composite thin films Figure represents the secondary electron microscopy (SEM) and atomic force microscopy (AFM) resultsThe files name with Rutherford backscattering spectroscopy (RBS) represent the sample condition about the irradiation and the analysis performed.The file name with H beam are elastic recoil detection ERDA analysis data X in Y irradiation are simulation data from SRIM software of X ions in Y elements.