XPS spectra for Li intercalated few-layer MoS2 films

Description Dataset for synchrotron-based x-ray photoelectron (XPS) spectra of Li doped MoS2 nanofilms grown on c-plane sapphire substrate by two techniques: thermally assisted conversion (TAC) and pulsed laser deposition (PLD). Reference spectra for undoped MoS2 were measured on a commercial MoS2 powder sample. Data formats The XPS datasets are available in two formats. VAMAS (ASCII ISO 14976). Plain text column files: Double-column files (dat) and corresponding metadata files (txt).