On the origin of resistive switching volatility in Ni/TiO2/Ni stacks
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Data for the paper "Cortese, Simone, Trapatseli, Maria and Khiat, Ali et al. (2016) On the origin of resistive switching volatility in Ni/TiO2/Ni stacks. Journal of Applied Physics" The file contains all the current versus voltage measurements described in the paper: the resistive switching mechanism curves are presented, as well as subthreshold effects related to the filament instability. The area dependence of the resistances involved is also present in the file.
创建时间：
2016-10-06
