<p> This data set consists of backside scanning electron microscope (SEM) images of four different CMOS integrated circuits (90nm, 65nm, 40nm and 28nm technologies) recorded for this study. The
This data set consists of backside scanning electron microscope (SEM) images of four different CMOS integrated circuits (90nm, 65nm, 40nm and 28nm technologies) recorded for this study. The images are
The submited dateset consist of 32 different trojan-inserted IP cores design. For each IP core design, the dataset provides some files that contain source code written in VHDL or Verilog design langua
