Supplement Number 1
收藏NIAID Data Ecosystem2026-05-10 收录
官方服务：
资源简介：
Materials and methods and additional figures including device fabrication process, XRD and XPS patterns, AFM images, TEM images, quasi-static capacitance-voltage (QSCV) measurement methods and results, time-dependent dielectric breakdown behavior of the devices
创建时间：
2026-01-16
