Simultaneous microscopic imaging of thickness and refractive index of thin layers by heterodyne interferometric reflectometry (HiRef) - data

This dataset contains 1)Simulated HiRef signals as function of film refractive index, thickness, and objective numerical aperture 2)Measured HiRef and qDIC data on PVA films and lipid bilayers 3)Analysed thickness and refractive index of the layers 4)Simulated effect of noise on the retrieved thickness and refractive index本数据集包含以下内容：1) 以薄膜折射率、厚度及物镜数值孔径为自变量的模拟高反射（HiRef）信号；2) 针对聚乙烯醇（PVA）薄膜与脂质双层的实测高反射（HiRef）信号与定量微分干涉相衬（qDIC）数据；3) 各层厚度与折射率的分析结果；4) 噪声对反演得到的厚度与折射率参数的影响模拟。