Analysis Results of the WD-XRF (normalized), and Comparison of the Results of WD-XRF with the Results of the p-ED-XRF Devices

Complete list of analyses results used in the article "Evaluation and Calibration of the p-ED-XRF Analyser “Tracer” (Co. Bruker) for Classifying Pottery from the Middle Euphrates in Comparison with WD-XRF-Results" by Antonia Höhne (former Hofmann). Upper part of the table: analysis results of the WD-XRF (normalized). Lower part of the table: comparison of the results of WD-XRF (oxides of major elements for comparison calculated for not ignited samples) with the results of the p-ED-XRF devices (Tracer and, where available, Niton). The analysis results are sorted according to individual fragment numbers (“number of fragment”), which in turn is made up of the find-spot number and a continuous number. “total” = sum of oxides (in %) of the original measurement before the normalization of the WD-XRF values. “l.o.i.” = loss on ignition. “n.m.” = not measured. For the sake of completeness, the elements affected with larger measurement errors in WD-XRF were also listed (elements in brackets). Ce is empirically affected with large measurement errors in the Niton measurements. The elements Se, Ag, Cd, Sn, Sb, Au, Hg, Hi and U were, indeed, measured with the Niton device, but remained below “LOD” (“limit of detection”) and therefore are not listed in the table.