Flat-Field Super-Resolution Localization Microscopy with a Low-Cost Refractive Beam-Shaping Element
收藏NIAID Data Ecosystem2026-05-02 收录
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资源简介：
Raw data for the article "Flat-Field Super-Resolution Localization Microscopy with a Low-Cost Refractive Beam-Shaping Element". Each set of three files is a set of dSTORM images, taken using either top-hat illumination or a Gaussian illumination. For Sample 0, the top-hat illumination was performed first. For Sample 1, the Gaussian illumination was performed first.
创建时间：
2024-08-02
