NIST X-ray Photoelectron Spectroscopy Database - SRD 20

NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding energy, Auger kinetic energy, chemical shift, and surface or interface core-level shift), retrieval of data for selected compounds (according to chemical name, selected groups of elements, or chemical classes), display of Wagner plots, and retrieval of data by scientific citation. For the newer data records, additional information is provided on the specimen material, the conditions of measurement, and the analysis of the data. Version 5.0 includes the addition of Digital Object Identifiers (DOI) to each of the citations. Additionally, Version 5.0 has new features including chemical shift plots, custom-built components for displaying both formatted molecular formulas and formatted spectral lines, and spectral sorting functions of photoelectron lines and Auger Parameters.