The effect of temperature and time is combined in the severity factor (SF; [42]). Values are presented as mean ± standard error. In parentheses is the fraction of total surface free energy.
The purpose of this experiment is to benchmark the new high-throughput XRR setup on the GMT instrument with a series of measurements of buried interfaces in direct bonded Si wafers
X-ray reflectivity (XRR) nowadays is limited to model surfaces employing mm-sized samples. The extent of real surfaces in applications (e.g., Li-ion batteries), which need improved fundamental underst
