The purpose of the experiment is to perform a practical with M2 students of the UGA. The topic of the practical will be the investigation of bonding interfaces in Si wafer using X-ray reflectivity.
The effect of temperature and time is combined in the severity factor (SF; [42]). Values are presented as mean ± standard error. In parentheses is the fraction of total surface free energy.
Abstract Title of program: FIREFLY II Catalogue number: AAQB Program obtainable from: CPC Program Library, Queen's University of Belfast, N. Ireland (see application form in this issue) Computer: ICL
