X-Ray Reflectivity measurement on Strontium(II) Chloride 0.4M

Name: X-Ray Reflectivity measurement on Strontium(II) Chloride 0.4M
Creator: DESY
Published: 2026-01-24T20:14:10+08:00

DataCite Commons2026-01-24 更新2026-04-25 收录

X射线反射率

溶液界面结构分析

数据链接：

https://doi.desy.de/detail/10.60883%2Fded431ba65 数据链接链接失效反馈

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资源简介：

X-Ray Reflectivity measurement on Strontium(II) Chloride 0.4M at P08 LISA

提供机构：

DESY

创建时间：

2026-01-24

X 射线反射率的角分辨率测试数据

X射线反射率

薄膜结构分析

本数据主要是针对考核指标提出的“X射线反射率的角分辨率"，在USAXS工业应用实验站发展了基于衍射仪搭建了薄膜反射率、掠入射及低角度入射散射装置。实现了基于掠入射/低角度入射散射（膜面内结构检测）、反射率技术（垂直膜表面方向结构检测）的薄膜三维结构检测技术的在线安装和测试。主要记录了X射线反射率的角分辨率测试数据。

国家基础学科公共科学数据中心110

Master 2 Practical : Investigation of Si bonding interfaces with X-ray reflectivity

材料表征

X射线反射率

The purpose of the experiment is to perform a practical with M2 students of the UGA. The topic of the practical will be the investigation of bonding interfaces in Si wafer using X-ray reflectivity.

Mendeley Data2024-01-31 更新90

Master 2 Practical : Investigation of Si bonding interfaces with X-ray reflectivity

硅键合界面分析

X射线反射率

The purpose of the experiment is to perform a practical with M2 students of the UGA. The topic of the practical will be the investigation of bonding interfaces in Si wafer using X-ray reflectivity.

ESRF Portal2025-01-01 更新40

A program for the calculation of x-ray reflection intensities

X射线反射率

粉末衍射

Abstract Title of program: FIREFLY II Catalogue number: AAQB Program obtainable from: CPC Program Library, Queen's University of Belfast, N. Ireland (see application form in this issue) Computer: ICL

Mendeley Data2024-06-25 更新100

EWOKS tests and XRR studies

X射线反射率

材料界面分析

testing EWOKS with XRR data on GMT and XRR studies of buried interfaces

ESRF Portal2028-01-01 更新80