异质结数据集

该数据集来源于中国科学院半导体研究所。该数据集包含低维材料异质结的制备过程和电学、光学测量方法；低维材料异质结通过转移平台精确的角度控制，将不同的低维材料统一按扶手椅方向或锯齿方向平行搭建，通过旋转精度< 0.1°的精确角度控制，研究异质结器件的性能变化；异质结器件的相关表征数据，如光学图像、原子力显微镜图像等；异质结器件的电学、光学测试数据，如电学输运测量、光电流和光吸收测量等。

This dataset is sourced from the Institute of Semiconductors, Chinese Academy of Sciences. It covers the preparation processes of low-dimensional material heterojunctions and the corresponding electrical and optical measurement methods. For the fabrication of these heterojunctions, a transfer platform with precise angle control is employed: different low-dimensional materials are aligned and stacked in parallel along either the armchair or zigzag direction, with a rotation accuracy of less than 0.1°, to study the performance changes of heterojunction devices. The dataset also includes characterization data of heterojunction devices, such as optical images and atomic force microscopy (AFM) images. Additionally, it contains electrical and optical test data for the devices, including electrical transport measurements, photocurrent measurements, and optical absorption measurements, among others.

搜集汇总

背景与挑战

背景概述

该数据集由中国科学院半导体研究所提供，专注于低维材料异质结的制备、表征及性能测试，包含精确角度控制下的电学和光学测量数据，适用于半导体器件与技术领域的研究。